EM-ISight-ESD system

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EM-ISight Automated ESD Scanner

Electrostatic discharge (ESD) events can lead to failures in electronic components and systems, such as short circuits and combustion, posing significant risks to device reliability and safety.

The APREL EM-ISight-ESD system offers manufacturers a powerful solution to identify design flaws and enhance product performance and safety prior to market release.

Utilizing advanced measurement methodologies, the system captures ESD events across spatial locations and resolves time and frequency domain data through high-bandwidth oscilloscopes. By integrating multiple measurement functions into a single capture, the EM-ISight-ESD system transforms how EMC engineers perform ESD analysis.

Engineered to support a broad range of testing applications, the ESD scanner delivers unparalleled capabilities for near-field analysis.

Features:

Time domain of an ESD event
Frequency domain of an ESD event
Spatial data of an ESD event
Visualization in either time or frequency through AVI movie
Dynamic touch detection and vision control
Compatibility with Oscilloscope, Spectrum Analyzer, Vector Network Analyzer

“Leveraging APREL's EM-ISight-ESD solution enabled us to resolve a critical design issue related to dropped data packets. During validation for a major customer, we encountered several challenges that raised concerns among the approval team. Using the EM-ISight-ESD solution, we assessed the impact of ESD signals across the frequency range, uncovering a minor design flaw that we quickly addressed—ultimately securing customer approval.

Without this solution, we would have faced a costly and disruptive redesign of our entire board, significantly impacting our project."

Program manager, automotive solutions

SYSTEM ELEMENTS AND CONFIGURATIONS

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The EM-ISight-ESD is a fully integrated test system designed to measure test subjects exposed to an electrostatic discharge (ESD) source. As an industry-first solution, it enables real-time measurement of ESD events across frequency, time, and spatial distribution.
It provides users with confidence in the accuracy and reliability of high-speed ESD event detection, helping to identify vulnerabilities that can lead to device damage.

Synchronization of the ESD event with data acquisition is achieved through the use of a broadband trigger probe. This ensures the ESD event is captured from its initiation and recorded continuously throughout its duration, up to the point of signal dissipation.

EM-ISight-ESD is a complete package including standard Near-Field measurement options in one fully automated system.

APREL offer the option for further system customization.

System Components:

6-axis robot arm
System controller running WinPro
Workstation
Boundary detection unit (BDU)
ESD H-field probe
Trigger synchronization probe
Vector probes
- magnetic 2mm-loop Hxy
- optional electric Exy and Ez
- SMA connector
ESD microstrip line
6GHz microstrip line
Low noise amplifier (LNA)
Device positioner
Set of cables
Vision system

Applications:

Automotive, LCD/OLED panels and televisions, industrial appliances, home appliances, avionics, radar systems, computers and communication devices, medical devices, medium scale network equipment, routers, switches, and base stations.

Oscilloscope readings

System validation setup

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During an Electrostatic Discharge (ESD) event, the intense electric field can ionize surrounding gas molecules, creating a short-lived plasma. Although this plasma typically persists for only microseconds to nanoseconds, it presents measurement challenges—most notably a “flooding” effect that obscures the precise location of ESD impacts due to ionization interference.

Integrating a launch pad during ESD testing effectively eliminates this initial plasma burst from the Device Under Test (DUT). By stabilizing the ambient air and minimizing dynamic fluctuations, a steady-state air interface is established. This enhances measurement repeatability and increases confidence in data accuracy.

Furthermore, the launch pad enables higher-resolution scans that precisely identify ESD impact areas at the pin or trace level. When combined with Fast Fourier Transform (FFT) functionality, the system achieves improved dynamic range and a lower noise floor—significantly enhancing the signal-to-noise ratio, especially when capturing data at frequencies above 10 MHz.

Features:

Corona effect (explosion of ionized air) can cause the signal to noise ratio of a detector to change
Low cost upgrade that provides better Return on Investment (RoI)
Exceeds requirements of IEC-61000

Module Components:

ESD test results without Launch Pad

ESD test results with Launch Pad

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H-Field broadband ESD vector probe for near field analysis designed for low insertion loss with high resolution detection.

Single element antenna mounted onto an advanced substrate using custom interfaced connector configuration.

Designed for use with the APREL EM-ISight-ESD solution, includes voltage isolation at the tip for 8kV applications.

Allows for a clean transition of the signal to the acquisition unit while rejecting any unwanted arcing (spark) from the ESD source.

Highly shielded magnetic vector probe with electric field rejection set to capture ESD events in line with IEC-61000-4 standard.

Trigger Probe:

ESD Trigger probe is designed for use with the EM-ISight-ESD measurement platform.
The purpose for this probe is to detect the leading edge of an ESD event over air to trigger the connected Oscilloscope for capturing the full signal from the ESD system.
Designed to be fully compatible with the IEC-61000-4 standard its use allows for easy integration onto the measurement space to ensure a closed circuit for capturing ESD events.

Discharge Probe:

Delivers an isolated air discharge to a device, preventing corona effect impact

Trigger Probe

ESD discharge probe

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Electromagnetic 6GHz near-field measurement module is a part of the EM-ISight-ESD system featuring passive low-Q probes designed to operate across wide bandwidth without interaction with a device.

Anisotropic nature of the near field with inconsistent wave impedance is addressed through the 360-degree rotation function.

For the microwave frequencies a precise spatial mapping of de-coupled electric and magnetic field distributions is typically achieved at the distance of 0.5 mm for PCBs and at 10 μm for integrated circuits.

There is an option for upgrade to 20GHz or 40GHz system configuration.

Optional Hz, Ez, and Exy probes are available.

Features:

EMC/EMI measurement
Upgraded step resolution of 10um with full 360-degree probe rotation
Multiple workspace options for off axis measurements
Fully automated software package for post measurement analysis and report generation
Integration of leading test and measurement equipment vendors
Magnetic field Hxy vector probe
Optional Ez, Exy, Hz near-field probes
Low-noise amplifier
RF-ISight-Light analytical software
Configuration upgrade to 20GHz or 40GHz system
Additional Hz, Ez, and Exy probes are available

Applications:

Integrated circuits and PCB fixtures, memory modules, 5G-connected devices, high-speed switches (Gigabit & beyond), phase array antennas, streaming devices, printed antenna modules, internet-of-things (IoT) products.

40GHz module

Near-field measurement results

EM-ISight-ESD system

EM-ISight Automated ESD Scanner

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​Electrostatic discharge (ESD) events can lead to failures in electronic components and systems, such as short circuits and combustion, posing significant risks to device reliability and safety.

The APREL EM-ISight-ESD system offers manufacturers a powerful solution to identify design flaws and enhance product performance and safety prior to market release.

​

​

Engineered to support a broad range of testing applications, the ESD scanner delivers unparalleled capabilities for near-field analysis.

​

Features:

Time domain of an ESD event

Frequency domain of an ESD event

Spatial data of an ESD event

Visualization in either time or frequency through AVI movie

Dynamic touch detection and vision control

Compatibility with Oscilloscope, Spectrum Analyzer, Vector Network Analyzer

SYSTEM ELEMENTS AND CONFIGURATIONS

Oscilloscope readings

System validation setup

Electrostatic discharge (ESD) events can lead to failures in electronic components and systems, such as short circuits and combustion, posing significant risks to device reliability and safety.